Pay in 4 interest-free payments of $28.88 Learn more
Ships within 48 hours · Estimated delivery Jul 29 - Aug 3
This Specification defines the reading window to increase the success probability of reading
本スタンダードは，global Silicon Wafer Committeeで技術的に承認されている。現版は2010年12月21日，global Audits and Reviews Subcommitteeにて発行が承認された。2011年2月にwww
SEMI E40-0309 (technical revision)
SEMI E57 — Mechanical Specification for Kinematic Couplings Used to Align and Support 300 mm Wafer Carriers
M04000 - SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Revision:SEMI M40-1109 - Superseded This Specification defines the readingglobal Silicon Wafer Committee200994global Audits and Reviews Subcommittee200910www. semi. org200911CD ROM20002 SEMI M1 3 Referenced SEMI Standards SEMI E89 Guide for Measurement System Analysis (MSA) SEMI M1 Specifications for Polished Single Crystal Silicon Wafers SEMI M20 Practice for Establishing a Wafer Coordinate System SEMI M50 Test Method for Determining Capture Rate and False Count Rate
US$ 372.50
US$ 220.00
US$ 267.50
US$ 225.00
US$ 247.50
US$ 30.00
US$ 290.00
US$ 227.50
US$ 162.50
US$ 265.00
US$ 225.00
US$ 147.50
US$ 290.00
US$ 290.00
US$ 340.00
US$ 297.50
US$ 225.00
US$ 232.50
US$ 932.50
US$ 140.00